What is CCTO?
Calcium Copper Titanate (CCTO)
CCTO (CaCu3Ti4O12) ceramic oxide particles for Laser Marking Pigments, LDS/MID screening, and electronic-ceramic study routes.
Technical owner: Aurexene Materials Engineering Team · Last updated: 2026-07-25
What It Is Not
- CCTO is calcium copper titanate, not a generic blend of calcium, copper, and titanium oxides.
When Not to Use It
- Do not use CCTO when low dielectric loss or device performance must be inferred from powder permittivity without fired-microstructure validation.
Intrinsic Screening Summary
- Identity screen
- CaCu3Ti4O12; Cubic-lattice perovskite oxide ceramic powder
- Intrinsic feature
- The review covers CCTO synthesis, dielectric properties, film deposition, and sensing applications, including processing routes and high dielectric behavior.
- Material-level integration
- Use when evaluating Laser Marking Pigments or LDS/MID formulations and systems.
Application Fit
Material Identity & Specification Status
Approved values for Density and Packaging are not published; confirm them during quotation or sample review.
| Property | Value |
|---|---|
| Composition | CaCu3Ti4O12 |
| CAS / identity | 12336-91-3 |
| Particle size | Micro grade D50 1-3 um and D90 3-5 um; nano grade D50 75-100 nm |
| Morphology | Cubic-lattice perovskite oxide ceramic powder |
| Purity | 99.99% |
| Storage | Dry sealed container |
Why It Works
| Structure | Function | Mechanism |
|---|---|---|
| CaCu3Ti4O12; Ceramic dielectric powder | CCTO supports Laser Marking Pigments, LDS/MID screening, and high-permittivity electronic-ceramic study routes. | The review covers CCTO synthesis, dielectric properties, film deposition, and sensing applications, including processing routes and high dielectric behavior. |
Technical Guides
| Technical Guide | Summary |
|---|---|
| CCTO Permittivity, Dielectric Loss, Leakage, and Internal-Barrier-Layer Behavior | Calcium Copper Titanate (CCTO) Permittivity, Dielectric Loss, Leakage, and Internal-Barrier-Layer Behavior — a method-conditioned engineering guide for MLCC Internal-Electrode, Termination & Dielectric Materials covering particle packing, surface oxide chemistry, shrinkage matching, grain-boundary behavior, and electrode-dielectric interface continuity, process limits, validation, and qualification boundaries. |
| Characterizing Nickel Powder, CCTO Powder, Pastes, Printed Layers, and Fired Microstructures | Characterizing Nickel Powder, Calcium Copper Titanate (CCTO) Powder, Pastes, Printed Layers, and Fired Microstructures — a method-conditioned engineering guide for MLCC Internal-Electrode, Termination & Dielectric Materials covering particle packing, surface oxide chemistry, shrinkage matching, grain-boundary behavior, and electrode-dielectric interface continuity, process limits, validation, and qualification boundaries. |
| Diagnosing Abnormal Grain Growth, Porosity, Secondary Phases, Cracks, and Warpage | Diagnosing Abnormal Grain Growth, Porosity, Secondary Phases, Cracks, and Warpage — a method-conditioned engineering guide for Varistor & Functional Ceramic Sensors covering structure-function behavior at the material, interface, and finished-system boundary, process limits, validation, and qualification boundaries. |
| Dispersing and Sintering CCTO Dielectric Powders Without Agglomeration or Abnormal Grain Growth | Dispersing and Sintering Calcium Copper Titanate (CCTO) Dielectric Powders Without Agglomeration or Abnormal Grain Growth — a method-conditioned engineering guide for MLCC Internal-Electrode, Termination & Dielectric Materials covering particle packing, surface oxide chemistry, shrinkage matching, grain-boundary behavior, and electrode-dielectric interface continuity, process limits, validation, and qualification boundaries. |
| Electrode Chemistry, Firing, Contact Formation, and Ceramic-Electrode Compatibility | Electrode Chemistry, Firing, Contact Formation, and Ceramic-Electrode Compatibility — a method-conditioned engineering guide for Varistor & Functional Ceramic Sensors covering structure-function behavior at the material, interface, and finished-system boundary, process limits, validation, and qualification boundaries. |
Documents & Inquiry
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Technical Data Sheet
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Safety Data Sheet
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Related resources
Grade, Sample & Qualification Support
The Aurexene Materials Engineering Team can review the required form, host system, formulation or process, target, sample quantity, volume and timeline, and the grade-specific evidence needed before qualification.
Review Lab Capabilities for sample evaluation and qualification support, or Production Capabilities for scale-up, quality, documentation, and supply support.
Request CCTO Sample / Qualification Review